Engineer's Office for Applied Spectroscopy supplies high-end measurement technology for photodiode array spectroscopy for 30 years now.
We specialize in film thickness measurement and plasma emission monitoring for the lab and in-line process controlling, offering customized solutions world-wide!
Our film thickness measurement technology uses the so-called "white-light interference" (the effect is shown on the soap bubble picture above) for non-contact and non-destructive determination of transparent single, double and even triple layers.
The fiber optics coupled TranSpec process spectrometers permit to trace almost any plasma emission of your PVD plasma in the entire UV...NIR spectral range, simultaneously and in real-time!
The TranSpec Lite film thickness gauges are designed mainly for manually performed but even though high-precise film thickness measurements in the lab. The instruments are used mainly for quality control, specially of automotive headlights.
FTM-ProVis Lite is a convenient and very easy-to-use software package, which permits to quickly perform high precision film thickness measurements of transparent layers using our TranSpec Lite film thickness gauges.
Our TranSpec process instruments are UV-VIS-NIR photodiode array spectrometers, which combine innovative optoelectronics with high performance digital electronics (optionally with halogen or combined deuterium/halogen lamps, as shown in the photo above) in just one 19'' rack. The TranSpec process spectrometer is used mainly for inline film thickness and plasma emission measurement tasks.
PEM-ProVis Professional is a convenient Windows software package for optical plasma emission measurements running on our fiber optics coupled TranSpec process spectrometer. The software permits to simultaneously trace up to 4 emission peaks at any wavelength selectable in the spectral range of approximately 200 nm to 1000 nm.
Bischof-Fischer-Str. 108
DE-73430 Aalen
Germany
sales@applied-spectroscopy.com
Fon +49 (0) 7361 97 53 280
Fax +49 (0) 7361 97 53 285