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Film
Thickness Measurement
These pages describe our film thickness measurement
technology using the white-light interference phenomenon. The FTM-Lite and TranSpec-DSP film thickness
gauges determine the thickness of transparent layers in the the range of 0.1-150
microns with an accuracy of ± 5 nanometer!
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FTM-Lite
- Film Thickness Gauges for USB 2.0
Our FTM-Lite VIS and FTM-Lite NIR film thickness gauges are designed especially for
manually performed but even though high-precise thickness measurements in
the lab.
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Plasma Emission Measurement
Our fiber optics coupled TranSpec-DSP spectrometers permit to trace almost any emission of your
PVD- Plasma in the
entire
UV-VIS-NIR
range. Simultaneously and in real-time! This allows an intermediate feedback for your
process gas flow control and vaporization progress.
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TranSpec-DSP
- High-Speed
Photodiode Array Spectrometer
These pages show our UV-VIS-NIR spectrometer, which combine innovative optoelectronics with high performance digital
electronics. The gauges measure up to 2,500 Spectra per second, loss-free at continuous scanning!
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