These pages describe our film thickness measurement
technology using the white-light interference phenomenon. Our TranSpec and
FTM-Lite film thickness
gauges determine the film thickness of thin transparent layers in the the range of
microns within an accuracy of ± 5 nanometer.
FTM-Lite ▪ Film Thickness Gauges
Our easy-to-use FTM-Lite film thickness gauges are designed especially for
manually performed but even though high-precise thickness measurements in
the lab. The handy instruments connect to any standard laptop using USB.
Plasma Emission Measurement
Our fiber optics coupled TranSpec spectrometers permit to trace almost any emission of your PVD
plasma in the
entire UV...NIR spectral
range, simultaneously and in real-time! This permits an intermediate feedback for your
process gas flow control and vaporization progress.
TranSpec ▪ Photodiode
These pages show our UV-VIS-NIR
photodiode array spectrometer, which combine innovative optoelectronics with
high performance digital electronics. The TranSpec process spectrometers are
used mainly for film thickness and plasma emission measurement tasks.