We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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TranSpec++  -- C/C++ class library for TranSpec-DSP spectrometer

 

For developing your own spectroscopy and photometry software applications on Windows 2000/XP we provide our powerful and easy-to-use programming library TranSpec++. Our TranSpec-DSP high-speed spectrometer are equipped with an integrated processor system, which performs the entire data acquisition and further spectra processing independently of the connected personal computer. The TranSpec++ class library is now used to communicate with TranSpec's Firmware in a client/server scheme, for instance, setting up measurement parameters, request TranSpec to perform measuring runs and retrieve the measured spectra. With this, the entire spectra acquisition, i.e. scanning the diode array, a possible raw data average, dark current correction and the spectra normalization is fully encapsulated in TranSpec++ and TranSpec's Firmware, so that the programmer can focus his developments on to the actual application. And, of course, TranSpec++ is delivered including source code. For a programming example, please download the PDF file below.


TranSpec++ Software - Product Information
   TranSpec++ Product Information as PDF file


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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany


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