We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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TranSpec 2000 -- Software for Optical Spectroscopy, Plasma Emission Monitoring and FIlm Thickness Measurement
 

TranSpec 2000 is a comfortable spectrometry software for Windows 2000/XP and is designed for the capabilities of our new TranSpec-DSP spectrometers. TranSpec 2000 permits to easily configure and execute various different film thickness measurement tasks on a TranSpec-DSP spectrometer.


The picture shows an exemplary window configuration
for film thickness measurements with TranSpec 2000.

TranSpec 2000 Product Information   TranSpec 2000 Product Information as PDF file
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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany

Company: 

Ing.-Buero Thomas Fuchs

Street Address: 

 Bischof-Fischer-Str. 108

Zip and City:  

73430 Aalen - Germany

Phone Number: 

+49  (0)7361 - 97 53 28 0

Fax Number: 

+49  (0)7361 - 97 53 28 5

E-Mail: 

 sales@applied-spectroscopy.com

VAT-ID: 

 DE 167178636

WEEE-Reg. No.: 

 DE 93698084