We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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TranSpec 2000 -- Software for Optical Spectroscopy, Plasma Emission Monitoring and FIlm Thickness Measurement

 

TranSpec 2000 is a comfortable spectrometry software for Windows 2000/XP and is designed for the capabilities of our new TranSpec-DSP spectrometers. TranSpec 2000 permits to easily configure and execute various different measurement tasks on a TranSpec spectrometer. The software is suitable especially for the plasma emission and film thickness measurement.


The picture above shows an exemplary window configuration for  plasma emission measurements with TranSpec 2000.


The picture above shows an exemplary window configuration for film thickness measurements with TranSpec 2000.


TranSpec 2000 Product Information
   TranSpec 2000 Product Information as PDF file


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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany


Company: 

Ing.-Buero Thomas Fuchs

Street Address: 

Bischof-Fischer-Str. 108

Zip and City:  

73430 Aalen - Germany

Phone Number: 

+49  (0)7361 - 97 53 28 0

Fax Number: 

+49  (0)7361 - 97 53 28 5

E-Mail: 

sales@applied-spectroscopy.com

VAT-ID: 

DE 167178636

WEEE-Reg. No.: 

DE 93698084