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FTM-Lite VIS: ~ 1-25 micrometer 

FTM-Lite NIR: ~ 2-100 micrometer

Our brand-new FTM-Lite film thickness gauges use the white-light interference phenomenon for film thickness determination of thin transparent layers. These instruments are designed especially for manually performed but even though high-precise measurements in the lab. Click here for Application Examples and Measurement Method Principles.

The FTM-Lite film thickness gauge consists of a TranSpec Lite photodiode array spectrometer (at bottom in the pictures), the HSL Lite halogen light source (at top in the pictures), a bifurcated fiber optics cable with probe holder and our FTM-ProVis Lite software package.

For developing your own film thickness applications using our FTM-Lite film thickness gauges, we provide our powerful and very easy-to-use FTM-Lite++ programming library as DLL using standard-C calls. This library can be used with C/C++, VBA (Excel), LabVIEW and many others.
 

This Website was edited last on January 3, 2012

© Copyright 1998-2012 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany

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