We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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Picture of TranSpec Film Thickness Gauge


The picture shows a typical film thickness gauge setup for lab measurement. The 19'' chassis on top is our TranSpec photodiode array spectrometer, the 19'' chassis below shows the HSL-2 halogen spectral lamp, which are both connected through a bifurcated fiber optics. The 3D film thickness profile of a protective lacquer of a Compact Disc has been measured in this example.
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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany

Company: 

Ing.-Buero Thomas Fuchs

Street Address: 

 Bischof-Fischer-Str. 108

Zip and City:  

73430 Aalen - Germany

Phone Number: 

+49  (0)7361 - 97 53 28 0

Fax Number: 

+49  (0)7361 - 97 53 28 5

E-Mail: 

 sales@applied-spectroscopy.com

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 DE 167178636

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 DE 93698084