We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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3D Film Thickness Profile of a Diamond Layer

The picture shows a 3D film thickness profile of a 10 mm˛ diamond layer on silicon in the thickness range of 800-1000 nanometers. Each of the 20 different colors maps a thickness range of 12 nm relatively. Note the microstructures at top/left on the plateau of the diamond layer, which are only a few nanometers thick!

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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany


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