We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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3D Film Thickness Profile of a CD-Lacquer

The picture shows a 3D film thickness profile of the protective lacquer of a standard commercial Compact-Disc in the range of 9-13 microns. Note the spot where at the liquid lacquer has been dropped during the spin coating!

This film thickness data record consists of more than 14,000 points and has been measured fully automatic using our TranSpec film thickness gauge and a 3-axes motion bridge.
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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany

Company: 

Ing.-Buero Thomas Fuchs

Street Address: 

 Bischof-Fischer-Str. 108

Zip and City:  

73430 Aalen - Germany

Phone Number: 

+49  (0)7361 - 97 53 28 0

Fax Number: 

+49  (0)7361 - 97 53 28 5

E-Mail: 

 sales@applied-spectroscopy.com

VAT-ID: 

 DE 167178636

WEEE-Reg. No.: 

 DE 93698084