We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany

Company: 

Ing.-Buero Thomas Fuchs

Street Address: 

 Bischof-Fischer-Str. 108

Zip and City:  

73430 Aalen - Germany

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+49  (0)7361 - 97 53 28 0

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+49  (0)7361 - 97 53 28 5

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 sales@applied-spectroscopy.com

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 DE 167178636

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 DE 93698084