We offer high-speed gauges for photodiode array spectroscopy, film thickness measurement and PVD plasma emission monitoring, specially for process measuring and control tasks. - Dipl.-Ing. (FH) Thomas Fuchs , Engineer's Office for Applied Spectroscopy TranSpec - Film Thickness Measurement and Plasma Monitoring

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Application Notes

 


Film Thickness Measurement

Film Thickness Measurement - Application Note

Plasma Emission Measurement
Plasma Emission Measurement  - Application Note

Film Thickness Measurement
for Lab usage
FTM-Lite VIS Thickness Gauge
1-25 Micrometer

FTM-Lite VIS Film Thickness Gauge - Poduct Information
FTM-Lite NIR Thickness Gauge
2-100 Micrometer

FTM-Lite NIR Film Thickness Gauge - Poduct Information

FTM-ProVis Lite Software

FTM-ProVis Lite Software - Poduct Information

FTM-Lite++  Programming Library
FTM-Lite++ Programming Library- Poduct Information

Film Thickness Measurement
for In-Line Process Control

TranSpec-DSP Spectrometer

TranSpec-DSP Spectrometer - Product Information

HSL-2 Halogen Spectral Lamp

HSL-2 Halogen Lamp - Product Information

FTM-ProVis 2000 Software
FTM-ProVis 2000  -  Poduct Information

Plasma Emission Measurement
Hardware and Software

TranSpec-DSP Spectrometer

TranSpec-DSP Spectrometer - Product Information

TranSpec 2000 Software

TranSpec 2000 - Product Information

TranSpec++ Programming Library
TranSpec++  Programming Library - Product Information

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This Website was edited last on February 12, 2008

© Copyright 1998-2008 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany


Company: 

Ing.-Buero Thomas Fuchs

Street Address: 

Bischof-Fischer-Str. 108

Zip and City:  

73430 Aalen - Germany

Phone Number: 

+49  (0)7361 - 97 53 28 0

Fax Number: 

+49  (0)7361 - 97 53 28 5

E-Mail: 

sales@applied-spectroscopy.com

VAT-ID: 

DE 167178636

WEEE-Reg. No.: 

DE 93698084