Engineer's Office for Applied Spectroscopy

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This page contains application notes and product brochures with detailed technical specifications as downloadable PDF files. Left-click on the PDF icons will open the PDF document in a new frame, right-click will safe the PDF file.
Application Notes Film Thickness Measurement
 
 
Plasma Emission Measurement
 
Film Thickness Measurement
for lab use		 FTM-Lite VIS Thickness Gauge
~ 1-25 micrometer
 
FTM-Lite NIR Thickness Gauge
~ 2-100 micrometer
 
FTM-ProVis Lite Software
 
 
FTM-Lite++  Programming Library
 
Film Thickness Measurement
 for in-line process control		 TranSpec Process Spectrometer
 
FTM-ProVis Professional Software
 
FTM-Lite++  Programming Library
 
Film Thickness Measurement
 on very small spots		 FTM-Micro Microscope
 
TranSpec Process Spectrometer
 
 
  FTM-ProVis Professional Software
 
Plasma Emission Measurement
hardware and software		 TranSpec Spectrometer
 
PEM-ProVis Professional Software
 
 
PEM-Lite++ Programming Library

This Website was edited last on January 1, 2010

© Copyright 1998-2010 by Thomas Fuchs, Engineer's Office for Applied Spectroscopy, Germany

Company:

   Ing.-Buero Thomas Fuchs

Street Address: 

   Bischof-Fischer-Str. 108

Zip and City:

   73430 Aalen - Germany

Phone Number:

   +49  (0)7361 - 97 53 28 0

Fax Number:

   +49  (0)7361 - 97 53 28 5

E-Mail: 

   sales@applied-spectroscopy.com

VAT-ID:

   DE 167178636

WEEE-Reg. No.:

   DE 93698084